Design for Testability and Test Generation with Two Clocks
نویسندگان
چکیده
منابع مشابه
Synchronizing the IEEE 1149.1 Test Access Port for Chip-Level Testability
testability standard in the industry. Although its mandatory provisions focus narrowly on boardlevel assembly verification testing, primarily via the boundary-scan register, its test access port (TAP) and many optional provisions make the standard usable for a much broader range of applications. Since its inception, numerous extensions and applications have been proposed that allow the standard...
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